Chemical Sensors: Simulation and Modeling Volume 1: Microstructural Characterization and Modeling of Metal Oxides

Microstructural Characterization

Ghenadii Korotcenkov

In Stock Date: 
06/15/2012
Print Price: 
$230.95
Print ISBN: 
978-1-60650-309-6
E-book Price: 
$208.00
E-book ISBN: 
9781606503119
Pages: 
440
Binding Type: 
Casebound
DOI: 
10.5643/9781606503119

Chemical sensors are integral to the automation of myriad industrial processes and everyday monitoring of such activities as public safety, engine performance, medical therapeutics, and many more. This 5 volume reference work covering simulation and modeling will serve as the perfect complement to Momentum Press's 6 volume reference works 'Chemical Sensors: Fundamentals of Sensing Materials' and 'Chemical Sensors: Comprehensive Sensor Technologies', which present detailed information related to materials, technologies, construction and application of various devices for chemical sensing. This 5 volume comprehensive reference work analyzes approaches used for computer simulation and modeling in various fields of chemical sensing and discusses various phenomena important for chemical sensing such as bulk and surface diffusion, adsorption, surface reactions, sintering, conductivity, mass transport, interphase interactions, etc. In this work it will be shown that theoretical modeling and simulation of the processes, being a basic for chemical sensors operation, could provide considerable progress in choosing both optimal materials and optimal configurations of sensing elements for using in chemical sensors. Each simulation and modeling volume in the present series reviews modeling principles and approaches peculiar to specific groups of materials and devices applied for chemical sensing. Volume 1: Microstructural Characterization and Modeling of Metal Oxides covers microstructural characterization of metal oxides using SEM, TEM, Raman spectroscopy and in-situ high temperature SEM, and multiscale atomistic simulation and modeling of metal oxides, including surface state, stability and metal oxide interactions with gas molecules, water and metals.

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Ghenadii Korotcenkov

Ghenadii Korotcenkov received his PhD in Physics and Technology of Semiconductor Materials and Devices from Technical University of Moldova in 1976 and his Dr. Sci. degree in Physics of Semiconductors and Dielectrics from Academy of Science of Moldova in 1990 (Highest Qualification Committee of the USSR, Moscow). He has more than 40-year experience as a teacher and scientific researcher.