Richard Brundle

Richard Brundle
Editor of Materials Characterization and Analysis

Christopher Richard (Dick) Brundle obtained his PhD in physical chemistry (London, and Oxford) in 1967, working in the early development of UV Photoelectron Spectroscopy (UPS), studying small molecules. After a postdoc period at Bell Labs, he was a lecturer in physical chemistry at Bradford University, UK, from 1970 to 1975, where he developed and implemented the first UHV X-Ray Photoelectron Spectroscopy (XPS) capability for surface studies. In 1975 he moved to IBM Research, San Jose, working in basic research (adsorption and reaction at metal and semiconductor surfaces), applications, and technical management in surface and thin-film analytical methods. In 1993 he formed his own consulting company and in 1998 joined Applied Materials as director of the Defect and Thin-Film Characterization Laboratory, where his work concentrated on methodology for root cause analysis for particle defects on full wafers, and on developing methods for analysis and characterization of ultra-thin films. In 2003 he returned to consulting.

He has over 200 publications, and was senior editor of the Journal of Electron Spectroscopy for 25 years. He has edited several books and book series, including Encyclopedia of Materials Characterization, and the 11 individual material characterization monographs that went with it (recently reissued by Momentum Press). He has had a long association with the American Vacuum Society (AVS) of which he is a Fellow, and has served on the Board of Directors and twice as the Chair of the Northern California Chapter. He has also taught professional Short Courses for over 30 years and has received two AVS major technical awards. He has been a Fellow of the American Physical Society since 1977.

The Materials Characterization and Analysis Collection!