Materials Characterization

Applied Chemistry for Environmental Engineering

Applied Chemistry for Environmental Engineering
Print Price: 
$79.95
In Stock Date: 
03/10/2016

Armen Casparian, Gergley Sirokman

Applied Chemistry for Environmental Engineering will provide further practical insight into how the principles of environmental chemistry, presented in their first book, Environmental Chemistry, can be applied to the measurement and observed effects of chemical pollution and toxins that have been introduced in the environment—and what can be done to prevent or abate those problems.

The Practice of TOF-SIMS: Time of Flight Secondary Ion Mass Spectrometry

The Practice of TOF-SIMS: Time of Flight Secondary Ion Mass Spectrometry
Print Price: 
$79.95
In Stock Date: 
04/01/2016

Alan Spool

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood.

A Practical Guide to Transmission Electron Microscopy, Volume II: Advanced Microscopy

Print Price: 
$79.95
In Stock Date: 
12/31/2015

Zhiping Luo

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron specimen atom interactions.

A Practical Guide to Transmission Electron Microscopy: Fundamentals

Print Price: 
$79.95
In Stock Date: 
12/04/2015

Zhiping Luo

Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron–specimen atom interactions.

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

 Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
Print Price: 
$79.95
In Stock Date: 
12/29/2015

Harland G. Tompkins and James N. Hilfiker

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more.

Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films

Auger Electron Spectroscopy
Print Price: 
$79.95
In Stock Date: 
07/28/2015

John Wolstenholme

This book discusses the use of AES and SAM for the characterization of a wide range of technological materials. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated.

Lean Six Sigma and Statistical Tools for Engineers and Engineering Managers

Lean Six Sigma and Statistical Tools for Engineers and Engineering Managers
Print Price: 
$79.95
In Stock Date: 
11/20/2015

Wei Zhan and Xuru Ding

The book focuses on the introduction of the basic concepts, processes, and tools used in Lean Six Sigma. A unique feature is the detailed discussion on Design for Six Sigma aided by computer modeling and simulation. The authors present several sample projects in which Lean Six Sigma and Design for Six Sigma were used to solve engineering problems or improve processes based on their own research and development experiences in engineering design and analysis.

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Ch
Print Price: 
$79.95
In Stock Date: 
09/14/2015

Fred Stevie

Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a function of depth, SIMS has proved to be a valued technique for a wide range of applications.

Photodynamic Therapy Mediated By Fullerenes and Their Derivatives

Photodynamic Therapy
Print Price: 
$89.95
In Stock Date: 
10/30/2012

Mike Hamblin

The Fullerene molecule is a carbon-based nano-scale structure of 60 carbon atoms arranged in a 3-dimensional soccer ball- like sphere. It is highly stable, but it can be modified with functional groups for desired biological activity. This new monograph in the ASME-Momentum Press series on Biomedical & Nanomedical Technologies will explore the basic physics and chemistry of Fullerenes, how the Fullerene molecule can be chemically modified with bio-active moieties, and then how it can be applied in clinical use. Examples of antimicrobial and anti-cancer uses will be discussed.

Characterization of Tribological Materials, Second Edition

Characterization of Tribological Materials, Second Edition cover
Print Price: 
$109.95
In Stock Date: 
12/15/2012

William A. Glaeser
C. Richard Brundle
Charles A. Evans, Jr.

This book is a concise introduction to the major characterization techniques used for Tribological Properties of Materials. "Characterization of Tribological Materials, 2nd edition features:

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