Materials Characterization Series

Characterization of Metals and Alloys

Characterization of Metals and Alloys Cover
Print Price: 
$108.95
E-book Price: 
$98.00
In Stock Date: 
04/15/2010

Paul H. Holloway
P. N. Vaidyanathan
C. Richard Brundle

A better understanding of the microstructure of metals and alloys has led to great advances in the performance and useful applications of these, the oldest of mankind’s engineered materials. This book in the Materials characterizations series focuses on the particular molecular and atomistic properties of metals insofar as how they affect the different techniques for measuring and analyzing internal structure, surface structure, and chemical/physical properties.

Characterization in Silicon Processing

Silicon Processing Cover
Print Price: 
$108.95
E-book Price: 
$98.00
In Stock Date: 
12/24/2009

Yale E. Strausser
C. Richard Brundle
Charles A. Evans

With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer manufacture where materials properties, processing and associated problems are brought to the fore. The book is organized by the types of materials commonly associated with integrated silicon semiconductor circuits and the typical processes involved for each such material, including deposition, thermal treatment, and lithography. Readers will find features such as:

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