Alan Spool

Alan Spool

Dr. Alan Spool is the TOF-SIMS lead in the Materials Lab in San Jose for Western Digital Corporation. He has been responsible for TOF-SIMS analysis at IBM, Hitachi Global Storage Technologies, HGST, a WD company, and now WD since 1991. He placed the very first order for a TRIFT based TOF-SIMS instrument on behalf of IBM in 1990. He earned his BS from Yale University, and his doctorate in Inorganic Chemistry from Columbia University. His post-doctorate in Mark Wrighton’s lab at MIT introduced him to the world of surface analysis. There he learned to perform XPS, Auger, and SIMS. In 1986 he joined IBM, initially doing XPS, but then RBS until 1991. He has been author or presenter of 36 papers including multiple invited talks, and the influential paper The Interpretation of Static Secondary Ion Mass Spectra in Surface and Interface Analysis in 2004. Dr. Spool was also a proud founding board member for the Vivace Youth Chorus of San Jose, for which his wife Peggy Spool is the founding Artistic Director.

The Practice of TOF-SIMS: Time of Flight Secondary Ion Mass Spectrometry

The Practice of TOF-SIMS: Time of Flight Secondary Ion Mass Spectrometry
Print Price: 
$49.95
E-book Price: 
$29.95
In Stock Date: 
04/01/2016

Alan Spool

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood.