Materials Characterization and Analysis

Raman Spectroscopy, Volume I: Principles and Applications in Chemistry, Physics, Materials Science, and Biology

Print Price: 
$49.95
E-book Price: 
$29.95
In Stock Date: 
01/24/2019

Günter Hoffmann

The book provides an up-to-date overview of the fast- growing area of Raman spectroscopy. The two-volume work describes how analytic methods using Raman spectroscopy allow for the chemical analysis of materials, providing even spatial resolution without precedent. In addition, external perturbations (strain, temperature, pressure) on molecules and their alignment can be analyzed. Raman spectroscopy can also provide information about the interactions of components, again at a high level of spatial resolution.

The Practice of TOF-SIMS: Time of Flight Secondary Ion Mass Spectrometry

The Practice of TOF-SIMS: Time of Flight Secondary Ion Mass Spectrometry
Print Price: 
$49.95
E-book Price: 
$29.95
In Stock Date: 
04/01/2016

Alan Spool

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood.

A Practical Guide to Transmission Electron Microscopy, Volume II: Advanced Microscopy

Print Price: 
$49.95
E-book Price: 
$29.95
In Stock Date: 
12/31/2015

Zhiping Luo

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron specimen atom interactions.

A Practical Guide to Transmission Electron Microscopy: Fundamentals

Print Price: 
$49.95
E-book Price: 
$29.95
In Stock Date: 
12/04/2015

Zhiping Luo

Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron–specimen atom interactions.

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
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$49.95
E-book Price: 
$29.95
In Stock Date: 
12/29/2015

Harland G. Tompkins and James N. Hilfiker

New and insightful article by the authors in the July issues of Vacuum and Coating Technology Magazine.

Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films

Auger Electron Spectroscopy
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$49.95
E-book Price: 
$29.95
In Stock Date: 
07/28/2015

John Wolstenholme

This book discusses the use of AES and SAM for the characterization of a wide range of technological materials. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated.

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Ch
Print Price: 
$49.95
E-book Price: 
$29.95
In Stock Date: 
09/14/2015

Fred Stevie

Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a function of depth, SIMS has proved to be a valued technique for a wide range of applications.

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